Principal Investigator

Robert Okojie
Organization: 
NASA Glenn Research Center
Bio: 

Dr. Robert S. Okojie received the BS, MS and Ph.D. degrees in Electrical Engineering from the New Jersey Institute of Technology, Newark, New Jersey, between 1991 and 1996. He was a Senior Research Scientist at Kulite Semiconductor Products, Inc., Leonia, NJ, from 1993 to 1997, developing high temperature ohmic contacts to silicon carbide (SiC) semiconductor that was then for the first time implemented as pressure sensor for high temperature applications. He joined Ford Microelectronics, Colorado Springs, CO, in 1997 as a Senior Research Engineer focusing on the development of MEMS-based sensors, smart fuel injectors, and associated MEMS packaging technologies. In August 1999, he joined the SiC research group at NASA Glenn Research Center, Cleveland OH, as an Electronics Engineer, primarily responsible for developing high temperature microsensors and enabling metal contacts and packaging technologies.

He was the recipient of the following recent awards: 2011 NASA GRC Distinguished Publication Award; 2009 NASA Abe Silverstein Medal in Research; 2002 Scientist of the Year by the National Technical Association for his exceptional accomplishments in advancing the state-of-the-art of microelectromechanical systems (MEMS) for use in harsh environments. He has also received several NASA Honor Awards in 2002 and 2004.

He is a Senior Member of the IEEE, member of the Scientific Research Society (Sigma Xi) and published over twenty peer reviewed papers in scientific journals and conference proceedings relating to his field, and a contributing author to the CRC MEMS Handbook now in second edition. He currently holds 12 patents relating to high temperature device technology and four pending applications.

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